MISA Advanced
2.950.0020
- Visão geral
The MISA system is no longer offered for sale but remains fully supported with service, technical support, and spare parts. Metrohm Instant SERS Analyzer (MISA) is a high performance, portable analyzer system used for rapid, trace level detection / identification of illicit materials, food additives and food contaminants. MISA features a high-efficiency spectrograph equipped with Metrohm's unique Orbital-Raster-Scan (ORS) technology. It has a minimal footprint and extended battery life, perfect for on-site testing or mobile laboratory applications. MISA offers various Laser Class 1 attachments for flexible sampling options. Analyzer operation is available through BlueTooth or USB connectivity.
The MISA Advanced package is a complete package that allows the user to perform SERS analyses using Metrohm's nanoparticle solutions and P-SERS strips.
The MISA Advanced package includes a MISA Vial Attachment, a P-SERS Attachment, a ASTM Calibration Standard, a USB Mini Cable, a USB Power Supply and MISA Cal software for operating the MISA instrument. A ruggedized protective case is also provided to securely store the instrument and accessories.
Este produto foi descontinuado, mas ainda oferecemos suporte.
Conheça MISA Advanced
MISA
O principal sistema portátil de detecção de traços para a detecção rápida de contaminantes em matrizes alimentares no local: fácil, rápido, flexível e sensível.Porquê escolher MISA?
Equipamento Seu MISA Advanced
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- peças incluídas
- peças opcionais
ASTM Calibration Standard
6.07501.010
50:50 (v:v) Toluene/Acetonitrile ASTM standard for calibration of the wavenumber axis of MIRA/MISA systems. Class 3B operation.
Micro Fiber Cleaning Cloth
6.7430.060
Cleaning cloth for monitors and optics.
Misa ruggedized carrying case
6.02707.030
Rugged carrying case for Misa and all accessories.
P-SERS Attachment
6.07505.030
Accommodates Metrohm's proprietary P-SERS strips. Operation with laser class 1. The P-SERS attachment allows full insertion of P-SERS strips ensuring optimal measurement conditions.
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