Arqueologia

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Correct identification of mineral phases in rock thin sections is essential to petrographic and petrologic analysis of rocks. Portable Raman coupled to an optical microscope gives chemical information along with the optical images to give a higher certainty of identification than traditionally used optical micropcopy alone.

Stamps are cultural heritage objects that provide an invaluable amount of historical information. There is an increase of counterfeit historical inks and it is imperative that fraudulent stamps can be identified and removed from the market. The portable Raman i-Raman EX® with a 1064 nm laser is used because it minimizes the fluorescence of the ink. The i-Raman EX® also has the functionality of low laser power reduction down to 1% to prevent sample burning and the Raman video microscope system analyzes the smallest of details, which is imperative for cultural heritage analysis of an 1885 historical envelope.

Portable Raman spectroscopy is an invaluable tool in the study of archaeological sites, allowing for in situ analysis which minimizes the impact of such studies on important cultural sites. The flexibility of the use of a fiber optic probe and tripod-mounted video microscope with a light weight instrument reduces the need for sampling, and increases the ability to make representative measurements over what can be very large sample areas. The information content of Raman spectroscopy aids in the understanding of the materials used in the construction and restoration of important archaeological sites, and in understanding the degradation that is occurring which should aid in preservation and restoration work.

It is widely accepted that prolonged exposure to hexavalent chromium compounds can have dire health effects. This has led to increased regulation of chromium-containing products and greater demand for technologies that can positively identify hexavalent chromium in potential matrices. These include paints, dyes, and primers, which can pose a problem for interrogation with Raman, as strongly colored materials often exhibit fluorescence when stimulated at 785 nm. Fluorescence can obscure the Raman signal and prevent positive identification. MIRA XTR DS provides all the functionality of handheld material ID with a new capability that selectively eXTRacts the Raman signal from fluorescent materials. Fluorescence rejection at 785 nm provides higher sensitivity and resolution than 1064 nm systems, as well as a much wider scope of applications amenable to Raman spectroscopy. MIRA XTR DS offers a comprehensive and versatile material ID test solution for field operations.