Near-infrared spectroscopy for monitoring a single-pot granulator

This Application Note describes the utilization possibilities of a new sensor design that permits, in combination with an NIRS XDS Process Analyzer, the determination of solvent residues in a High-Shear Granulator during the drying phase. This system configuration reduces the scattering of the density distribution of the powder samples so that it is possible, directly in the process, to model the water and solvent content precisely.