TechnArt 2019
7/05/2019 - 10/05/2019 (Conference Centre 'Oud Sint-Jan', Brugge)

Datum: 7/5/2019 - 10/5/2019
Locatie: Conference Centre 'Oud Sint-Jan', Brugge
Taal: Engels
Meer info:
www.uantwerpen.be

TechnArt 2019

The main aim of this congress is to provide a scientific forum to present and promote the use of analytical techniques in the field of cultural heritage.

The meeting offers an outstanding opportunity for exchanging knowledge and experience on leading edge developments in cultural heritage analysis. This includes studies on pigments, lithic materials, metals, glass, ceramics, resins and fibres and also chemometrics, forensic applications, art history, archaeology and conservation science.

Conference topics:

  • X-ray analysis (XRF, PIXE, XRD, SEM-EDX)
  • Confocal X-ray microscopy (3D µ-XRF, 3D µ-PIXE)
  • Synchrotron, ion beam and neutron based techniques/instrumentation
  • FT-IR and Raman spectroscopy and microscopy
  • UV-Vis and NIR absorption/reflectance and fluorescence
  • Laser-based analytical methods (LIBS etc.)
  • Magnetic resonance techniques
  • Chromatography (GC, HPLC) and mass spectrometry
  • Optical and coherent imaging techniques
  • Mobile spectrometry and spectroscopy
  • Remote sensing and hyperspectral imaging
  • Case studies employing one or more analytical methods
    The meeting offers an outstanding opportunity for exchanging knowledge and experience on leading edge developments in cultural heritage analysis. This includes studies on pigments, lithic materials, metals, glass, ceramics, resins and fibres and also chemometrics, forensic applications, art history, archaeology and conservation science.
Visit the BW&Tek (Metrohm) booth !