Retsch Technology | Particle Characterisation

Retsch Technology develops and sells state-of-the-art optical measuring systems for particle size and particle shape analysis. Retsch Technology analysers, which operate on the basis of different measurement technologies, permit the particle characterisation of suspensions, emulsions, colloidal systems, powders, granules and bulk materials in a size range from 0.3 nm to 30 mm.


  • Dynamic Image Analysis
  • Static Image Analysis
  • Laser Light Scattering

Dynamic Image Analysis

Dynamic Image Analysis

Dynamic Image Analysis (DIA) is a powerful state-of-the-art method for particle size and shape characterisation of powders, granules and suspensions. Thanks to the patented dual camera technology these analysers cover a wide dynamic measuring range from 20 µm to 30 mm and from 0.8 µm to 8 mm respectively.


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Static Image Analysis

Static Image Analysis

The particle size / particle shape analyser is designed for precise characterisation of powders and suspensions down to the low micron range by static image analysis. Features a powerful illumination unit, a highly precise sample stage and five objectives with magnifications from 2.5 x to 50 x.


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Laser Light Scattering

Laser Light Scattering

The most important methods for the characterization of particles in the nanometer and micrometer range are dynamic laser light scattering and static laser light scattering (laser diffraction). Static laser light scattering is used for the analysis of emulsions, suspensions and dry samples.


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